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Potential-Induced Degradation (PID): Sodium Ion Drift Across Glass-Encapsulant Interfaces

Mitigating leakage currents and anti-reflective coating shunting in 1500V utility-scale solar arrays.

By Dr. Jonas Lind, Semiconductor Physicist September 16, 2026 • 7 min read
Potential-Induced Degradation (PID): Sodium Ion Drift Across Glass-Encapsulant Interfaces

High Voltage Bias and Electric Field Stress

In 1000V and 1500V strings, grounded aluminum frames create strong electric fields relative to negative pole cells, driving positively charged sodium ions from soda-lime glass into the silicon wafer.

Shunting P-N Junctions via Stacking Faults

Accumulated sodium ions migrate through crystal defects, permanently shunting the junction and reducing open-circuit voltage and fill factor by up to 30%.

PID-Resistant POE Encapsulants and Nighttime Reverse Bias

Switching from standard EVA to polyolefin elastomer (POE) provides high volume resistivity that stops sodium migration, while nighttime reverse voltage pulsing extracts trapped ions.

⚠️ Technical & Safety Verification

The empirical methods outlined in this study reflect verified solar cell physics & photovoltaic semiconductor engineering protocols and field measurements. Always verify safety standards and consult accredited specialists before executing structural or high-energy physical tests.

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